Fastest measurement speed

Save time and multiply measurement throughput

The internal R&S®FSWP sources enable measurement of highly sensitive oscillators such as DROs and OCXOs with a minimum number of cross correlations, saving considerable time. Adding hardware accelerated signal processing to the R&S®FSWP phase noise analyzer enables real-time phase noise measurements. Short measurement time is key since it speeds up the development to manufacturing process while increasing production throughput.

Unrivaled sensitivity

Highest sensitivity for phase and amplitude noise measurement

The R&S®FSWP internal local oscillator surpasses phase-noise performance of almost any signal generator available on the market. Thanks to the internal low‑noise analyzer sources, just a few correlations are needed to measure a high-quality oscillator. This allows for the fastest possible measurement times.

Highest flexibility

High-end phase noise analyzer and signal and spectrum analyzer in a single box

Users can examine the spectrum and demodulate the signal to measure EVM or pulse characteristics in different measurement channels. Designers of automatic test systems save space and money since they do not have to purchase an additional spectrum analyzer or vector signal analyzer. The R&S®FSWP is a future-proof investment. It is based on the high-end R&S®FSW with its unique RF performance and high sensitivity.

Phase noise of pulsed signals

Easy analysis of pulsed signal sources

Measuring the phase noise of pulsed sources used in radar applications has never been easier. The R&S®FSWP captures the signal and calculates all pulse parameters instantaneously. It offers cross‑correlation for phase noise tests and automatically determines the trigger/gating parameters required for pulsed source measurements. Gating enables the R&S®FSWP to achieve a larger dynamic range for pulsed phase noise measurements compared to other methods.

Residual/additive phase noise measurements

Residual PN measurements on pulsed and CW signals

For high‑end radar applications, knowing the additional phase noise added by individual components (e.g. amplifiers) to the signal path is crucial, since these influence pulse-to-pulse phase stability. The components have to be tested using pulsed signals under real-world conditions. The R&S®FSWP has an internal signal source for measuring residual phase noise or pulse-to-pulse phase stability and it also provides  additional inputs for other external sources.

Measure VCO parameters automatically

The R&S®FSWP features extremely low‑noise internal DC sources to supply and control voltage-controlled oscillators (VCO). The R&S®FSWP measures not only the fundamental voltage but also the power of the higher VCO harmonics relative to the tuning voltage. It also displays phase noise at various offset frequencies relative to the tuning voltage.

Transient analysis

Frequency and phase measurements in the time domain

The R&S®FSWP offers up to 8 GHz bandwidth for analyzing frequency or phase characteristics versus time. The R&S®FSWP also offers narrowband analysis down to 40 MHz to examine the transient response of PLLs in detail.

Amplitude and phase noise in parallel

Simultaneous measurement of amplitude noise and phase noise

The R&S®FSWP allows concurrent measurement of amplitude and phase noise up to a frequency offset of 30 MHz. It displays both results simultaneously in a single window or in separate windows.

Allan variance

Allan variance calculation from close-in phase noise 

To characterize oscillator frequency stability, the R&S®FSWP calculates the Allan variance from the phase noise and displays it for up to 1 million seconds (minimum offset: 1 μHz). Unlike the time domain methods, this makes it easy to suppress undesired side effects that appear as spurious emissions in the phase noise spectrum. Even short-term disturbances due to the phase noise from internal sources can be easily suppressed with cross-correlation.